How to choose the measurement probes to optimize the metrological inspection process

We continue with the special #stayathome campaign and today we bring you a fourth TRAINING PILL in webinar format where we will explain how to optimize a metrological inspection system by selecting the most suitable probes.

This webinar is aimed at all those companies that use coordinate measuring machines (CMM) for the quality control of their parts and want to optimize their inspection process.

How to choose the measurement probes to optimize the metrological inspection process

mapvision beneficios

In the webinar we will present the main measurement probes available to use on your CMM.

  • Touch-trigger probe (TP2, TP20, TP200)
  • Scanning probe (SP25, SP80)
  • 5 axis probe (PH20, Revo)
  • Non contact probe (Surface Measure laser scanner and QVP vision probe)
  • Roughness probe (Surftest Probe)

We will explain the strengths of each probe and how its use affects uncertainty and measurement conditions.

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2 june

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from 10:00 to 11:00

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Microsoft Teams

In order to attend the webinar you must register in advance. Send an email to aisasi@sariki.es indicating: name and surname, company, department and telephone.We will send you an access link to the webinar once we receive your registration.

Language of the webinar: Spanish

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